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材料导报  2024, Vol. 38 Issue (21): 23050211-8    https://doi.org/10.11896/cldb.23050211
  无机非金属及其复合材料 |
方钴矿热电器件性能衰减影响因素研究
左彤1, 唐显1,*, 李鑫1,*, 何虎1, 牛厂磊1, 隋解和2, 郭逢凯2
1 中国原子能科学研究院核技术综合研究所,北京 102413
2 哈尔滨工业大学材料科学与工程学院,哈尔滨 150001
Study on the Factors Influencing the Performance Attenuation of Skutterudite Thermoelectric Devices
ZUO Tong1, TANG Xian1,*, LI Xin1,*, HE Hu1, NIU Changlei1, SUI Jiehe2, GUO Fengkai2
1 Institute of Nuclear Technology, China Institute of Atomic Energy, Beijing 102413, China
2 School of Materials Science and Engineering, Harbin Institute of Technology, Harbin 150001, China
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摘要 热电器件性能直接影响着热电转换装置的转换效率及使用寿命。本工作针对方钴矿热电器件高温服役环境下性能衰减的问题,采用大功率热电器件测试系统开展热电器件服役性能影响因素研究。结果表明,方钴矿热电转换装置输出功率随着时间延长而显著降低,其主要原因在于高温条件下方钴矿热电材料、电极材料与Fe基防扩散阻挡层之间发生相互反应生成扩散层,致使界面电阻增大;同时,由于热电材料、电极材料与Fe基防扩散阻挡层的热膨胀系数匹配性能不佳,高温条件下焊接界面处开裂,热电器件内阻增大。由此可见,防扩散阻挡层的高温稳定性和热膨胀匹配性是影响方钴矿热电器件性能的关键,成为后续方钴矿热电器件实现工程应用的核心问题。
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左彤
唐显
李鑫
何虎
牛厂磊
隋解和
郭逢凯
关键词:  热电器件  防扩散阻挡层  热电转换  方钴矿材料    
Abstract: The performance of thermoelectric devices directly affects the conversion efficiency and service life of thermoelectric conversion devices. This work focused on the issue of performance degradation of cobalt-based thermoelectric devices in high-temperature service environments. A high-power thermoelectric device testing system was used to study the factors affecting the service performance of thermoelectric devices. The research results indicate that the output power of the cobaltite thermoelectric conversion device significantly decreases with time, mainly due to the mutual reaction among the skutterudite compound, electrode material, and Fe-based diffusion barrier layer under high temperature conditions, resulting in an increase in interface resistance. At the same time, due to the poor thermal expansion matching among the thermoelectric materials, electrode materials and Fe-based diffusion barrier layer, the welding interface cracks under high temperature conditions, and the internal resistance of the thermoelectric device increases. From this, it can be seen that the high-temperature stability and thermal expansion matching of the diffusion barrier layer are the key factors affecting the performance of skutterudite thermoelectric devices, and have become the core issues for the subsequent engineering applications of skutterudite thermoelectric devices.
Key words:  thermoelectric device    diffusion barrier layer    thermoelectric conversion    skutterudite
出版日期:  2024-11-10      发布日期:  2024-11-11
ZTFLH:  TN377  
通讯作者:  *唐显,中国原子能科学研究院核技术综合研究所研究员、硕士研究生导师,2002 年北京师范大学应化专业毕业,其后于中国原子能科学研究院工作至今,主要从事放射性同位素技术研究,发表论文10余篇,申请专利30 余项。tangxian79@sohu.com;李鑫,中国原子能科学研究院核技术综合研究所研究员、硕士研究生导师,1998年哈尔滨工业大学材料科学与工程学院毕业,其后于中国原子能科学研究院工作至今,主要从事核电源技术研究。获省部级科学技术奖项10余项,发表论文10余篇,申请专利10余项。lixin_0128@sina.com   
作者简介:  左彤,2021年6月于湖南大学获得工学学士学位。现为中国原子能科学研究院核技术综合研究所硕士研究生,在唐显、李鑫老师的指导下进行研究。目前主要研究领域为热电材料及器件制备应用。
引用本文:    
左彤, 唐显, 李鑫, 何虎, 牛厂磊, 隋解和, 郭逢凯. 方钴矿热电器件性能衰减影响因素研究[J]. 材料导报, 2024, 38(21): 23050211-8.
ZUO Tong, TANG Xian, LI Xin, HE Hu, NIU Changlei, SUI Jiehe, GUO Fengkai. Study on the Factors Influencing the Performance Attenuation of Skutterudite Thermoelectric Devices. Materials Reports, 2024, 38(21): 23050211-8.
链接本文:  
http://www.mater-rep.com/CN/10.11896/cldb.23050211  或          http://www.mater-rep.com/CN/Y2024/V38/I21/23050211
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