Abstract: Double layer TiO2-SiO2/SiO2 composite anti-reflective thin films were prepared by sol-gel method. The refractive index and thickness of the layer was regulated, then optical performance of the films prepared were researched. The film morphology, film thickness, refractive index and transmittance of the films were investigated by field emission scanning electron microscopy (FESEM), ellipsometer and ultraviolet-visible-infrared spectrophotometer, respectively. The results show that the refractive index of TiO2-SiO2 thin film prepared is about 1.5—2.0. Better optical performance of the double layer is obtained when the thickness of TiO2-SiO2 and SiO2 are 160 nm and 90 nm, The films show significant transmittance improvement in wide light wavelength of 380—1 100 nm, the maximum transmittance in visible light can reach to 97.5%, and the average transmittance is 93.9%.
马立云, 汤永康, 鲍田, 金良茂, 甘治平, 李刚. 宽谱增透双层TiO2-SiO2/SiO2薄膜的制备与性能[J]. 材料导报, 2019, 33(Z2): 161-164.
MA Liyun, TANG Yongkang, BAO Tian, JIN Liangmao, GAN Zhiping, LI Gang. Preparation and Performance Study of Double Layer TiO2-SiO2/SiO2Anti-reflection Films in Wide Optical Wavelength. Materials Reports, 2019, 33(Z2): 161-164.
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