Abstract: This work aims to deeply investigate the influences of a high volume fraction of interfacial intermetallic compound (IMC) upon the shear properties and fractured surface morphologies of the Cu/Sn37Pb/Cu solder joints. We conducted the shear-fracture test, explored and analyzed the IMCs’ growths, shear strengths and fracture modes of a series of Cu/Sn37Pb/Cu solder joints which differed in reflowing time and aging time. Our experiment observed the gradual thickening and flattening of the interfacial Cu3Sn layer as well as the increasing and enlarging Kirkendall voids at the Cu3Sn/Cu interface as the aging treatment processed. The thickening of the interfacial Cu3Sn layer led to an increase → decrease trend of the joint’s shear strength, which might be attri-buted to the excessive thickness of the brittle IMC layer or the grain coarsening of Sn-rish phase and Pb-rich phase. The solder joints with shorter aging time and reflowing time had a relatively higher volume fraction of bulk solder and displayed a ductile fracture mode. However, as the aging time or reflowing time were prolonged, the fracture mode gradually changed into a ductile-brittle mixed failure mode, and to a ductile fracture mode finally.
1 Wang X M. Experimental study on tensile strength and fracture mode of solder joint IMC Layer[D]. Beijing: Beijing industry university,2012(in Chinese). 王旭明.焊锡接点IMC层拉伸强度与断裂模式实验研究[D].北京:北京工业大学,2012. 2 Choudhury S F, Ladani L. Grain growth orientation and anisotropy in Cu6Sn5 intermetallic: Nanoindentation and electron backscatter diffraction analysis[J]. Electronic Materials,2014,43(4):996. 3 Choudhury S F, Ladani L. Effect of intermetallic compounds on the thermo-mechanical fatigue life of three-dimensional integrated circuit package micro solder bumps: Finite element analysis and study[J]. Journal of Electronic Packaging,2015,137(4):64. 4 Zhang L, Xue S B, Zeng G, et al. Interface reaction between SnAgCu/SnAgCuCe solders and Cu substrate subjected to thermal cycling and isothermal aging[J]. Journal of Alloys and Compounds,2012,510:38. 5 Li H, An R, Wang C, et al. In situ quantitative study of microstructural evolution at the interface of Sn3.0Ag0.5Cu/Cu solder joint during solid state aging[J]. Journal of Alloys and Compounds,2015,634:94. 6 Kar A, Ghosh Ma, Ray A K, et al. Effect of copper addition on the microstructure and mechanical properties of lead free solder alloy[J]. Materials Science and Engineering A,2007,459:69. 7 Kim D G, Jang H S, Kim J W, et al. Correlation between the interfacial reaction and mechanical joint strength of the flip chip solder bump during isothermal aging[J]. Journal of Materials Science: Materials in Electronics,2005,16(9):603. 8 Shih Po-Cheng, Lin Kwang-Lung. Correlation between interfacial microstructure and shear behavior of Sn-Ag-Cu solder ball joined with Sn-Zn-Bi paste[J]. Journal of Materials Science,2007,42(8):2574. 9 Bhat K N, Prabhu K N, Satyanarayan. Effect of reflow temperature and substrate roughness on wettability, IMC growth and shear strength of SAC387/Cu bonds[J]. Journal of Materials: Materials in Electronics,2014,25:864. 10 Hu Xiaowu, Li Yulong, Liu Yong. Microstructure and shear strength of Sn37Pb/Cu solder joints subjected to isothermal aging[J]. Microelectronics Reliability,2014,54(8):1575. 11 Zhu Q S, Guo J J, Shang P J, et al. Effects of aging on interfacial microstructure and reliability between SnAgCu solder and FeNi/Cu UBM[J]. Advanced Engineering Materials,2010,12(6):497. 12 Deng X, Piotrowski G, Williams J J, et al. Influence of initial morphology and thickness of Cu6Sn5 and Cu3Sn intermetallics on growth and evolution during thermal aging of Sn-Ag solder/Cu joints[J]. Journal of Materials,2003,32(12):1403. 13 Liu Tao-Chi, Liu Chien-Min, et.al. Eliminate Kirkendall voids in solder reactions on nanotwinned copper[J]. Scripta Materialia,2013,68:241 14 Hu Xiaowu, Ke Zunrong. Growth behavior of interfacial Cu-Sn intermetallic compounds of Sn/Cu reaction couples during dip soldering and aging[J]. Journal of Materials: Materials in Electronics,2014,25:936. 15 Zou J,Wu F S,Wang B. The trouble of Kirkendall voids in the micro-solder joints of electronic packaging[J]. Electronic Technology,2010,31(1):1(in Chinese). 邹建,吴丰顺,王波.电子封装微焊点中的柯肯达尔孔洞问题[J].电子工艺技术,2010,31(1):1. 16 Xing F, Yao J, Liang J, et al. Influence of intermetallic growth on the mechanical properties of Zn-Sn-Cu-Bi/Cu solder joints[J]. Journal of Alloys and Compounds,2015,649:1053. 17 Chen Y J, Chung C K, Yang C R, et al. Single-joint shear strength of micro Cu pillar solder bumps with different amounts of intermetallics[J]. Microelectronic Reliability,2013,53(1):47. 18 Lee H T, Lin H S, Lee C S, et al. Reliability of Sn-Ag-Sb lead-free solder joints[J]. Materials Scienceand Engineering A,2005,407:36. 19 Soud Farhan Choudhury, Leila Ladani.Local shear stress-strain response of Sn-3.5Ag/Cu solder joint with high fraction of intermetallic compounds: Experimental analysis[J]. Journal of Alloys and Compounds,2016,680(25):665. 20 Lee H T, Hu S Y, Hong T F, et al. The shear strength and fracture behavior of Sn-Ag-xSb solder Joints with Au/Ni-P/Cu UBM[J]. Journal of Electronic Materials,2008,37(6):867. 21 Talebanpour B, Huang Z, Chen Z, et al. Effect of joint scale and processing on the fracture of Sn-3Ag-0.5Cu solder joints: Application to micro-bumps in 3D packages[J].Journal of Electronic Materials,2015,45(1):57. 22 Hu Xiaowu, Chen Wenjing, Yu Xiao.Shear strengths and fracture behaviors of Cu/Sn37Pb/Cu soldered joints subjected to different displacement rates[J]. Journal of Alloys and Compounds,2014,600:13.