Abstract: The microstructure and properties of Al-Mg-Si alloy conducting wire prepared by multi-pass ECAE process were studied by means of S4800 scanning electron microscope (SEM), Philips DM420 transmission electron microscope (TEM), SANS CMT5105 electronic universal material testing machine and QJ48 double arm DC bridge. The results show that the grain of Al-Mg-Si alloy conducting wire with an average size of 10 μm or even smaller can be prepared by 4 passes ECAE dynamic forming. The tensile strength of the conducting wire increases with the increase of Mg, Si contents, however, the elongation and equivalent decrease. After soaked at 160-170 ℃ for 7 h, tensile strength, elongation and equivalent conductivity of the Al-0.59%Mg-0.59%Si alloy conductor were about 305.71-309.63 MPa, 4.7%-5.4% and 55.18%IACS-56.33%IACS, respectively. Hence the electric conductivity properties of the Al-Mg-Si alloy conductor are greatly improved compared to traditional Al-Mg-Si alloy conductor (whose tensile strength and equivalent conductivity are 295 MPa and 52.5%IACS, respectively).
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