铋系超导薄膜面内取向的X射线测量方法

doi:10.11896/cldb.22070253

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Abstract The X-ray Φ scanning method was used to characterize the spatial orientation of Bi2201 film, especially the in-plane orientation, by taking bismuth-based superconducting thin films growing on a single-crystal MgO substrate as an example, combined with the crystal structure characteristics of the studied materials. The single-crystal film Bi2201 did not exhibit simple ‘cube-on-cube'-style growth on the single-crystal MgO substrate. Based on c-axis epitaxial growth, Bi2201 film was epitaxially grown by rotating 45° around the MgO (001) crystal direction in the a-b plane; that is, the film was selectively (001) [100] _Bi2201∥(001) [110] _MgO in in-plane-oriented epitaxial growth. The work describes the principles and specific experimental steps of the measurement method in detail. The results indicate that the method provides a new way to measure and analyze the in-plane preferred orientation of single-crystal or strongly preferred orientation film materials and the mismatch relationship between single-crystal or strongly preferred orientation film materials and a single-crystal substrate.

Key words： bismuth based superconducting film preferred orientation Φ scanning X-ray

Published: Online: 2023-09-06

CLC number:

TB31

Fund:National Natural Science Foundation of China (52174308).

Corresponding Authors: *Tong He, is working as associate professor in Northeastern University.She received her Ph.D degree (successive postgraduate and doctoral programs of study) in material science from Northeastern University in 2008.Her research interests are in the area of texture,characterization of structural parameters of thin film materials.In recent years,she has presided three national scientific research projects,and four horizontal scientific research projects.She participated in nearly 10 national major science and technology special projects,such as the National Science and Technology Support Plan,973,and 863 projects.She has published more than 10 academic papers in SCI,such as Metals and Materials International,Materials Transaction,JIM,Materials Characterization,Journal of Iron and Steel Research International,and International Journal of Modern Physics B.tonghe503@126.com

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Cite this article:

HE Tong,YANG Yiqiao,SUN Wei. In-plane Orientation Determination of Bismuth-based Superconducting Films by X-ray Diffraction[J]. Materials Reports, 2023, 37(S1): 22070253-5.

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http://www.mater-rep.com/EN/10.11896/cldb.22070253 OR http://www.mater-rep.com/EN/Y2023/V37/IS1/22070253

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