基于Voronoi网络和有限元仿真模型的稳定型ZnO压敏电阻直流老化特性分析

doi:10.11896/cldb.24090232

Abstract
Figure/Table
References
Related Citation (1)

Download:

Full Text ( PDF ) (21508KB)
Export: BibTeX | EndNote (RIS)

Abstract In modern ZnO varistors, traditional aging mechanisms based on increased power consumption are no longer relevant due to reduced power consumption during DC aging. Prolonged exposure to both AC and DC voltages results in increased leakage current, decreased breakdown voltage, and lower nonlinearity, ultimately compromising their protective performance. To investigate the evolution in electrical properties during DC aging, this work developed a finite element model based on Voronoi networks and conducted accelerated aging tests on commercial varistors. Throughout the aging process, current-voltage characteristics and Schottky barrier parameters were measured and analyzed. The results indicate that when subjected to constant voltage, current flows through regions with larger grain sizes, forming discharge channels. As aging progresses, the current focus increases on these channels, leading to a decline in the varistor’s overall performance. Furthermore, analysis of the Schottky barrier parameters shows that the changes in electrical performance during aging are non-monotonic. These findings offer theoretical support for understanding the aging mechanisms and condition assessment of modern stable ZnO varistors.

Key words： ZnO varistors Voronoi network DC aging finite element method (FEM) current distribution double Schottky barrier theory

Published: 25 January 2026 Online: 2026-01-27

CLC number:

TM281+.1

	Service
	E-mail this article
	Add to my bookshelf
	Add to citation manager
	E-mail Alert
	RSS
	Articles by authors
	ZHANG Ping
	LU Mingtai
	LU Tiantian
	YUE Yinghu

Cite this article:

ZHANG Ping,LU Mingtai,LU Tiantian, et al. Analysis of DC Aging Characteristics of Stable ZnO Varistors Based on Voronoi Network and Finite Element Simulation Model[J]. Materials Reports, 2026, 40(2): 24090232-9.

URL:

https://www.mater-rep.com/EN/10.11896/cldb.24090232 OR https://www.mater-rep.com/EN/Y2026/V40/I2/24090232

1 Chen X J,Chen W J, He Z M, et al. In:2014 International Conference on Power System Technology. Chengdu, China, 2014, pp, 2322.
2 Zhang Q Z, Wang S H, Dong X H, et al. Electronics, 2021, 10(21), 2624.
3 Huang Y W, Wu K N, Tang Z, et al. Ceramics International, 2019, 45(1), 1110.
4 Liu J, He J L, Hu J, et al. Materials Chemistry & Physics, 2011, 125(1-2), 9.
5 Kaufmann B, Billovits T, Supancic P. Journal of the European Ceramic Society, 2021, 41(3), 1969.
6 Pike G E. Physical Review B, 1984, 30(6), 3274.
7 Ebrahimizadeh Abrishami M, Kompany A, Hosseini S M. Journal of Electroceramics, 2012, 29, 125.
8 Vojta A, Wen Q, Clarke D R. Computational Materials Science, 1996, 6(1), 51.
9 Bartkowiak M, Mahan G D, Modine F A, et al. Journal of Applied Physics, 1996, 79(1), 273.
10 Eda K. MRS Online Proceedings Library (OPL), 1981, 5, 381.
11 Meng P F, Liu Z, Cao W, et al. Proceedings of the CSEE, 2021, 41(5), 1588.
12 Topcagic Z, Tsovilis T, Krizaj D. Electric Power Systems Research, 2018, 164, 253.
13 Topcagic Z, Mlakar M, Tsovilis T E. IEEE Transactions on Power Delivery, 2019, 35(3), 1180.
14 Tanaka T, Tsuge R, Baba Y, et al. IEEE Transactions on Electromagnetic Compatibility, 2020, 62(6), 2638.
15 Zhou Q B, Yang H X, Huang X, et al. High Voltage, 2021, 6(4), 711.
16 Zhou Q B, Huang X, Cao T, et al. IET Generation, Transmission & Distribution, 2022, 16(18), 3636.
17 Zhou Q B, Shen J W, Xiao Y J, et al. Electric Power Systems Research, 2024, 227, 109982.
18 Lin Z C, Zhou L J, Huang L, et al. Electric Power Systems Research, 2024, 229, 110096.
19 Cheng L H, Li G R, Yuan K Y, et al. Journal of the American Ceramic Society, 2012, 95(3), 1004.
20 Guo J K, Meng P F, Liu Z, et al. In:2023 12th Asia-Pacific International Conference on Lightning (APL). Malaysia, 2023, pp.1.
21 Prudenziati M, Masoero A, Rietto A M. Journal of Applied Physics, 1985, 58(1), 345.
22 Eda K. IEEE Electrical Insulation Magazine, 1989, 5(6), 28.
23 IEEE Std C62. 11-2020. IEEE Standard for Metal-Oxide Surge Arresters for Ac Power Circuits (＞1 kV). 2020.
24 IEC 60099-4. Part 4: Metal-Oxide Surge Arresters without Gaps for a. c. Systems. 2014.
25 Kirkby P, Erven C C, Nigol O. IEEE Transactions on Power Delivery, 1988, 3(4), 1656.
26 Guo M, Zhao X, Shi W D, et al. Journal of the European Ceramic Society, 2022, 42(1), 162.
27 He J L, Cheng C L, Hu J. AIP Advances, 2016, 6(3).
28 Gupta T K, Carlson W G. Journal of Materials Science, 1985, 20, 3487.
29 Hayashi M, Haba M, Hirano S, et al. Journal of Applied Physics, 1982, 53(8), 5754.
30 Cheng Z L, Hou Z K, Wang Y, et al. Physical Review Applied, 2022, 17(3), 034042.
31 Zhao X, Shen H B, Guo M, et al. Energies, 2021, 14(13), 4011.
32 Wen Y D, Zhao X, Zhang B Y, et al. In:2022 IEEE International Con-ference on High Voltage Engineering and Applications (ICHVE). Chongqing, China, 2022, pp.1.
33 Zhao X, Guo M, Zhang Z H, et al. Journal of Alloys and Compounds, 2022, 894, 162543.