二次电子产额影响因素的研究进展

doi:10.11896/cldb.22030065

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Abstract The phenomenon of secondary electron emission widely exists in microanalysis, electron multiplication, aerospace, high-voltage power transmission, particle accelerators and so on. Hence, research on it is necessary. This paper firstly introduces the background knowledge about secondary electrons. Secondly, considering the whole process from electron-material interactions to the measurements of secondary electron yield, this paper classifies the factors affecting the secondary electron yield into four broad categories:nature of the incident electrons, properties of the sample, surface condition of the sample, test conditions and methods. Founded on that, this paper conducts a literature review and a comprehensive analysis. Finally, this paper summarizes the progress of the current research, sorts out the relevant laws, points out the shortco-mings, and discusses the possible development trend in the field.

Key words： secondary electron secondary electron yield properties of the incident electrons properties of the sample experimental condition

Published: Online: 2023-12-19

CLC number:

O046

Fund:Institute of Electrical Engineering, CAS (E155440101).

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	Articles by authors
	DENG Chenhui
	HAN Li
	WANG Yan
	GAO Zhaoshun
	NIU Geng

Cite this article:

DENG Chenhui,HAN Li,WANG Yan, et al. Progress in the Study of Factors Influencing the Secondary Electron Yield[J]. Materials Reports, 2023, 37(24): 22030065-10.

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http://www.mater-rep.com/EN/10.11896/cldb.22030065 OR http://www.mater-rep.com/EN/Y2023/V37/I24/22030065

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