原子力显微镜的工作原理及其在电化学原位测试中的应用

doi:10.11896/cldb.21030036

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Abstract Atomic force microscopy (AFM) is a kind of useful analytical instrument in surface micro-analysis. AFM gains information based on the inte-raction between the probe tip and sample, so that it can work in vacuum, atmosphere or liquid environment. Apart from three-dimensional topography, AFM provides information of electrical and mechanical properties in nanoscale. Nowadays, AFM is an ideal platform in the field of in-situ micro-analysis due to the versatility and the diversity of its working environment. The article summarized the applications of in-situ AFM in the fields of electrochemical corrosion, interface process in Li-ion battery and dynamics in the electrochemical reaction in solutions.

Key words： atomic force microscopy electrochemistry in-situ micro-characterization

Published: Online: 2022-07-26

CLC number:

TS205.5

Fund:National Natural Science Foundation of China (51801065) and the Young Innovative Talents Program for Colleges and Universities in Guangdong Province (2020KQNCX002).

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	LIU Jinchao
	CUI Jie

Cite this article:

LIU Jinchao,CUI Jie. Atomic Force Microscopy: Principles and Applications in the Field of In-situ Electro-chemical Characterization[J]. Materials Reports, 2022, 36(14): 21030036-11.

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http://www.mater-rep.com/EN/10.11896/cldb.21030036 OR http://www.mater-rep.com/EN/Y2022/V36/I14/21030036

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