METALS AND METAL MATRIX COMPOSITES |
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Influence Mechanism of Texture on the Accuracy of X-ray Stress Measurement for 6061-T6 Aluminum Alloy |
WANG Xiaopeng, LI Xiaoyan, WU Qi, XU Zhou
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School of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China |
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Abstract In order to explore the influence of texture on the X-ray stress measurement of 6061-T6 aluminum alloy, this paper used X-ray for stress mea-surement of the preset stress on the surface of constant stress beam, using electron backscatter diffraction (EBSD) technology and crystal orientation imaging analysis technology to analyze the effect of texture on the number of diffraction crystals according to the angular relationship between grain orientation and incident X-ray beam. Further more, the effects of texture on the homogeneity of microscopic strain and microscopic stress were discussed. The results show that when the orientation of diffraction crystal was in the range of ψ=0—15°, the texture led to a decrease in the number of diffraction crystals, which caused differences of microscopic strain and microscopic stress among different diffraction grain groups, these differences made the measured change of diffraction angle unable to reflect the change of diffraction angle caused by stress, so the stress measurement accuracy was reduced.
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Published: 06 November 2020
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About author:: Xiaopeng Wangis a postgraduate student at Beijing University of Technology, he is mainly engaged in the research of nondestructive tests for welding residual stress. Xiaoyan Lireceived his Ph.D. degree in materials from Harbin Institute of Technology in 1992. He has been a professor at Beijing University of Technology since 1998 and a doctoral tutor since 2000. He is mainly engaged in research on microelectronic assembly materials and technologies, nondestructive testing and evaluation of materials, and information engineering technology. He has published more than 100 papers in important journals at home and abroad. |
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