激光红外热成像技术在材料缺陷检测中的研究和应用现状

doi:10.11896/cldb.18110095

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Abstract In the industrial production process, it is important to find out the defects generated during the service of the materials in time. Compared with traditional detection methods such as eddy current and infiltration, and active infrared detection technology such as ultrasonic and flashing lights, laser infrared thermography not only has the advantages of no contact, no pollution, high detection efficiency, online detection, etc., but also has the unique advantage of high energy density and high-intensity energy input to small areas, allowing for the detection of small defects in materials over long distances.
　　However, since the defect detection is performed by the active excitation of the laser, heat is required to be accumulated on the surface or near the surface of the material, and is captured by the thermal imager and imaged after processing. Therefore, for low emissivity, low absorptivity materials, laser infrared thermography is often unsatisfactory. At the same time, the characterization of material defects is a hotspot and a difficult point in research, especially the depth features that are difficult to characterize. Researchers often use the image processing and process met-hods to quantitatively identify and characterize defect features. In addition, the research on metal materials is more in-depth, especially the detection of surface cracks of metal materials, so the surface crack defects are more perfect. However, the research on the detection of defects in other materials such as composite materials and ceramic materials has gradually increased in recent years. There are still insufficient deficiencies in the delamination and adhesion of composite materials, and new feature parameters need to be proposed to improve.
　　In recent years, the research results of laser infrared thermography to detect material defects have increased dramatically, and the detection objects have gradually widened, no longer limited to metal materials, and research on material defects such as composite materials, ceramic materials and semiconductors has been increasing. The characterization of defects is also shifting from qualitative identification to quantitative characterization.
　　This paper reviews laser infrared thermography under laser point, line and surface excitation modes. The detection principle of laser infrared thermography is expounded. The research status and application of this technology on metal, composite, ceramic materials and other types of material defect detection are introduced, and the further development direction of this technology is summarized.

Key words： laser infrared thermography material defect defect detection

Published: 16 January 2020

CLC number:

TG115.28

About author:: Bozheng Wangis a master student of the School of Engineering and Technology, China University of Geos-ciences (Beijing), and he is jointly trained at National Key Laboratory for Remanufaeturing of Academy of Armored Forces under the guidance of researcher Haidou Wang, associate researcher Lihong Dong and associate professor Jiajie Kang. The main research field is infrared nondestructive testing;Lihong Dongis an associate researcher, doctoral tutor at National Key Laboratory for Remanufaeturing of Academy of Armored Forces. The research direction is non-destructive testing and remanufacturing life assessment. Published more than 30 papers;Haidou Wangis executive deputy director, researcher and doctoral tutor of the National Key Laboratory for Remanufaeturing of Academy of Armored Forces, mainly engaged in remanufacturing engineering and surface engineering research. Chief scientist of the National Defense 973 Program, winner of the National Science Fund for Distinguished Young Scholars.

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Cite this article:

WANG Bozheng,DONG Lihong,WANG Haidou, et al. Research and Application of Laser Infrared Thermography in Material Defect Detection[J]. Materials Reports, 2020, 34(5): 5127-5132.

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http://www.mater-rep.com/EN/10.11896/cldb.18110095 OR http://www.mater-rep.com/EN/Y2020/V34/I5/5127

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