FERROELECTRIC AND FERROMAGNETIC MATERIALS |
|
|
|
|
|
Measurement of Transverse Piezoelectric Coefficients of Pb(Zr0.52Ti0.48)O3 Thin Films by a Mechano-electrical Multiphysics Coupling, Bulge Test Method |
HE Yuandong1, SUN Changzhen1, MAO Weiguo1, MAO Yiqi2, ZHANG Honglong3, CHEN Yanfei3, PEI Yongmao3, FANG Daining4
|
1 School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105; 2 College of Mechanical and Vehicle Engineering, Hunan University, Changsha 410082; 3 College of Engineering, Peking University, Beijing 100871; 4 Institute of Advanced Structure Technology, Beijing Institute of Technology, Beijing 100081; |
|
|
Abstract On the measuring of transverse piezoelectric coefficients of Pb(Zr0.52Ti0.48)O3 (PZT) thin films, we derived the mechano-electrical coupling bulge constitutive equations of PZT thin films on the basis of bulge test model and ferroelectric constitutive equations. The bulge samples were prepared by sol-gel and chemical etching methods. Mechano-electrical coupling bulge tests were performed by using modified force-electric experimental platform under the applied voltage between 0—14 V. The results showed that the elastic modulus and residual stress of PZT thin films were 91.9 GPa and 36.2 MPa under pure force field, respectively. The transverse piezoelectric coefficients d31 of PZT thin films increased from -28.9 pm/V to -45.8 pm/V when the voltage increased from 2 V to 14 V. Our work provides an effective analysis method for the transverse piezoelectric properties of other ferroelectric thin film materials by using the modified mechano-electrical coupling bulge test and the corresponding constitutive equations.
|
Published: 10 August 2017
Online: 2018-05-04
|
|
|
|
1 Sivanandan K, Achuthan A T, Kumar V, et al. Fabrication and transverse piezoelectric characteristics of PZT thick-film actuators on alumina substrates[J]. Sens Actuat A: Phys,2008,148(1):134. 2 Lefki K, Dormans G J M. Measurement of piezoelectric coefficients of ferroelectric thin films[J]. J Appl Phys,1994,76(3):1764. 3 Kim D, Kim H. Piezoelectric properties of lead zirconate titanate thin films characterized by the pneumatic loading method[J]. Integrated Ferroelectrics,1999,24(1-4):107. 4 Park G T, Choi J J, Ryu J, et al. Measurement of piezoelectric coefficients of lead zirconate titanate thin films by strain-monitoring pneumatic loading method[J]. Appl Phys Lett,2002,80(24):4606. 5 Shepard J F, Moses P J, Trolier-Mckinstry S. The wafer flexure technique for the determination of the transverse piezoelectric coefficient (d31) of PZT thin films[J]. Sens Actuat A: Phys,1998,71(1):133. 6 Shepard J F, Chu F, Kanno I, et al. Characterization and aging response of the d31 piezoelectric coefficient of lead zirconate titanate thin films[J]. J Appl Phys,1999,85(9):6711. 7 Maria J P, Shepard J F, Trolier-McKinstry S, et al. Characterization of the piezoelectric properties of Pb0.98Ba0.02(Mg1/3Nb2/3)O3-PbTiO3 epitaxial thin films[J]. Int J Appl Ceram Technol,2005,2(1):51. 8 Kholkin A L, Wütchrich C, Taylor D V, et al. Interferometric measurements of electric field-induced displacements in piezoelectric thin films[J]. Rev Sci Instruments,1996,67(5):1935. 9 Luginbuhl P, Racine G A, Lerch P, et al. Piezoelectric cantilever beams actuated by PZT sol-gel thin film[J]. Sens Actuat A: Phys,1996,54(1):530. 10 Zhang Q M, Pan W Y, Cross L E. Laser interferometer for the study of piezoelectric and electrostrictive strains[J]. J Appl Phys,1988,63(8):2492. 11 Dubois M A, Muralt P. Measurement of the effective transverse piezoelectric coefficient e31,f of AlN and Pb(ZrxTi1-x)O3 thin films[J]. Sens Actuat A: Phys,1999,77(2):106. 12 Nishio S, Kurokawa F, Tsujiura Y, et al. Precise piezoelectric cha-racterization of Pb(Hf,Ti)O3 thin films deposited by combinatorial sputtering[J]. Thin Solid Films,2016,616:444. 13 Ambika D, Kumar V, Tomioka K, et al. Deposition of PZT thin films with {001}, {110}, and {111} crystallographic orientations and their transverse piezoelectric characteristics[J]. Adv Mater Lett, 2012,3(2):102. 14 Kanno I, Kotera H, Wasa K. Measurement of transverse piezoelectric properties of PZT thin films[J]. Sens Actuat A: Phys,2003,107(1):68. 15 Chun D M, Sato M, Kanno I. Precise measurement of the transverse piezoelectric coefficient for thin films on anisotropic substrate[J]. J Appl Phys,2013,113(4):044111. 16 Dekkers M, Boschker H, Van Z M, et al. The significance of the piezoelectric coefficient d31,eff determined from cantilever structures[J]. J Micromech Microeng,2012,23(2):025008. 17 Dufay T, Guiffard B, Thomas J C, et al. Transverse piezoelectric coefficient measurement of flexible lead zirconate titanate thin films[J]. J Appl Phys,2015,117(20):204101. 18 Xiang Y, Tsui T Y, Vlassak J J, et al. Measuring the elastic modulus and ultimate strength of low-k dielectric materials by means of the bulge test[C]//Proceedings of the IEEE 2004 International Interconnect Technology Conference. Burlingame,2004:133. 19 Lee H K, Ko S H, Han J S, et al. Mechanical properties measurement of silicon nitride thin films using the bulge test[C]//Proc. SPIE 6798 Microelectronics: Design, Technology, and Packaging Ⅲ. Canberra,2007:67981C. 20 方岱宁, 毛卫国, 冯雪, 等. 电磁智能材料力电磁耦合行为的鼓泡实验装置及测试方法: 中国, ZL102645372A[P].2012-08-22. 21 Timoshenko S, Woinowsky-Krieger S. Theory of plates and shells[M]. New York: McGraw-Hill, 1959:282. 22 Moulson A J, Herbert J M. Electroceramics: Materials, properties, applications[M]. Wiley,2003:256. 23 Lin P. The in-situ measurement of mechanical properties of multi-layer coatings[D]. Cambridge: Massachusetts Institute of Technology,1990. 24 Vlassak J J, Nix W D. A new bulge test technique for the determination of Young′s modulus and Poisson′s ratio of thin films[J]. J Mater Res,1992,7(12):3242. 25 Allen M G. Measurement of mechanical properties and adhesion of thin polyimide films[D]. Cambridge: Massachusetts Institute of Technology,1986. 26 Tabata O, Kawahata K, Sugiyama S, et al. Mechanical property measurements of thin films using load-deflection of composite rectangular membranes[J]. Sens Actuat,1989,20(1-2):135. 27 王春雷, 李吉超, 赵明磊. 压电铁电物理[M]. 北京:科学出版社,2009:180. 28 毛卫国, 丁佳, 戴翠英, 等. 一种层状电磁薄膜功能材料鼓包试样的制备方法: 中国, ZL103682086A[P].2014-03-26. 29 毛卫国, 肖敏, 戴翠英, 等. 一种层状电磁薄膜材料鼓包样品的制备方法: 中国, ZL103762307A[P].2014-04-30. 30 Zhang Y J, Zheng X J, Jiao F, et al. The effect of strain and dead layer on the nonlinear electric-mechanical behavior of ferroelectric thin films[J]. Comput Mater Sci,2013,77:377. 31 Lian L, Sottos N R. Stress effects in sol-gel derived ferroelectric thin films[J]. J Appl Phys,2004, 95(2):629. 32 Zhang L, Tsaur J, Maeda R. Residual stress study of SiO2/Pt/Pb-(Zr,Ti)O3/Pt multilayer structure for micro electro mechanical system applications[J]. Jpn J Appl Phys,2003,42(3):1386. 33 Li Y, Feng S, Wu W, et al. Temperature dependent mechanical property of PZT film: An investigation by nanoindentation[J]. PloS One,2015,10(3):0116478. 34 Bahr D F, Robach J S, Wright J S, et al. Mechanical deformation of PZT thin films for MEMS applications[J]. Mater Sci Eng A,1999,259(1):126. 35 Liu D, Zhou B, et al. Determination of the true Young′s modulus of Pb (Zr0.52Ti0.48)O3 films by nanoindentation: Effects of film orientation and substrate[J]. J Am Ceram Soc,2011,94 (11):3698. 36 Zheng X, Li J, Zhou Y. X-ray diffraction measurement of residual stress in PZT thin films prepared by pulsed laser deposition[J]. Acta Mater,2004,52(11):3313. 37 Zheng X J, Yang Z Y, Zhou Y C. Residual stresses in Pb(Zr0.52-Ti0.48)O3 thin films deposited by metal organic decomposition[J]. Scr Mater,2003,49(1):71. 38 Zhou Y C, Yang Z Y, Zheng X J. Residual stress in PZT thin films prepared by pulsed laser deposition[J]. Surf Coat Technol,2003,162(2):202. 39 Zhu H, Chu D. Measurement of residual stresses in ferroelectric Pb-(Zr0.3Ti0.7)O3 fhin films by X-ray diffraction[J]. Jpn J Appl Phys,2013,52(12R):128004. 40 Ma B, Liu S, Tong S, et al. Residual stress of (Pb0.92La0.08)-(Zr0.52Ti0.48)O3 films grown by a sol-gel process[J]. Smart Mater Struct,2013,22(5):055019. 41 Yao K, Yu S, Tay F E H. Residual stress analysis in ferroelectric Pb(Zr0.52Ti0.48)O3 thin films fabricated by a sol-gel process[J]. Appl Phys Lett,2003,82(25):4540. |
[1] |
SUN Changzhen, HE Yuandong, MAO Weiguo, GU Yang , MAO Yiqi, ZHANG Honglong, CHEN Yanfei, PEI Yongmao, FANG Daining. Analysis of Mechanical-magnetic Coupling Characteristics of NiFe2O4 Thin Film Based on Modified Bulge Tests[J]. Materials Reports, 2017, 31(15): 145-148. |
|
|
|
|