AFM峰值力轻敲模式下石墨烯与迈科烯结构稳定性的比较

doi:10.11896/cldb.20070329

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Abstract In this paper, the structural stability of graphene and MXene was compared by peak force tapping mode of AFM. When in-situ scanning of two-dimensional material of reduced graphene oxide (rGO), the morphology of rGO did not change with time, which indicated that peak force tapping mode had no damage effect on the stable structure surface; when in-situ scanning of two-dimensional material V₂C, nano-etching occurred on the surface of V₂C, and the morphology surface area decreased with scanning time. The data processing software was used to analyze the area change and calculate the nano etching rate. It was found that the average nano-etching rate increased with the increase of the peak force, and the etching rate in the atmospheric environment was higher than that in the glove box (Ar atmosphere, the content of H₂O and O₂ was less than 1×10^-6), which indicated that the moisture in the atmosphere had an impact on the stability of the material and would accelerate the nano-etching. This study shows that the peak force tapping mode of AFM can be used to qualitatively characterize the stability of two-dimensional materials.

Key words： two-dimensional material in-situ atomic force microscope peak force tapping nanolithography stability

Published: 25 November 2021 Online: 2021-12-13

CLC number:

TB303

Fund:Zhejiang Natural Science Foundation-Taizhou Joint Fund (LTY20B030001).

About author: Lihang Chen, graduated from China Jiliang University with a bachelor of science degree in June 2019. Currently, he is conducting research under the guidance of professor Cai Shen. At present, his main research area is material surface/interface structure microanalysis.
Lingzhi Cheong, professor in Food Biotechnology, Ningbo University. She has published more than 60 SCI papers in domestic and foreign journals, applied for 9 invention patents (1 authorization), written 4 monographs and won 5 provincial and municipal awards.
Cai Shenreceived his Ph.D. degree in Chemistry from the University of St Andrews at UK in 2008. Before joining Ningbo Institute of Materials Technology and Enginee-ring, Chinese Academy of Science as an associate professor, he worked as a postdoc fellow in the University of Maryland (USA) and Aarhus University (Denmark). His research interests include electrochemistry, atomic force microscopy and other surface science rela-ted topics. He has published more than 90 papers in peer-reviewed journals including JACS, ACS Nano, Energy Storage Materials, Nano Energy, Small Methods, Ultramicroscopy and Journal of Microscopy. He is on the editorial board for a number of journals including Journal of Microscopy.
Zhaoping Liu, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, senior researcher, doctoral supervisor. His main research direction is graphene and power lithium ion battery and its material technology. He has published more than 170 papers.These authors contributed equally to this work.

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	CHEN Lihang
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Cite this article:

CHEN Lihang,CHEONG Lingzhi,SHEN Cai, et al. Comparison of Structure Stability of Graphene and MXene by Peak Force Tapping Mode of Atomic Force Microscope[J]. Materials Reports, 2021, 35(22): 22006-22010.

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http://www.mater-rep.com/EN/10.11896/cldb.20070329 OR http://www.mater-rep.com/EN/Y2021/V35/I22/22006

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