Materials Reports  2018, Vol. 32 Issue (6): 870-873     https://doi.org/10.11896/j.issn.1005-023X.2018.06.004
RESEARCH PAPER |
Critical Field Intensity Control for Metal-insulator Transition of Vanadium Dioxide Thin Film: a Methodological Study
SHAN Shihao, WANG Qingguo, QU Zhaoming, CHENG Wei, LI Ang
Institute of Electrostatic &
Electromagnetic Protection, Ordnance Engineering College, Shijiazhuang 050003