扫描Kelvin探针力显微镜:工作原理及在材料腐蚀研究中的应用

doi:10.11896/j.issn.1005-023X.2018.07.016

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Abstract Scanning Kelvin probe force microscopy (SPFKM) is a material measuring and characterizing technique which applies scanning Kelvin probe on the basis of atomic force microscopy (AFM) and has been gaining momentum in recent years. It involves simultaneously the nanometer-level topography measurement and the in-situ high-resolution volta potential mapping, thereby providing a novel insight in investigating the mechanisms of materials’ corrosion behaviours. The present paper sketches out the principles with respect to the two working modes of SKPFM, summarizes the unresolved issues that have emerged in SPFKM’s application, and also renders a comparative discussion between SKPFM and the traditional SKP technique. The review offers an elaborate delineation about the application of SKPFM in corrosion science, and ends with a rough description of the opportunities and challenges.

Key words： scanning Kelvin probe force microscopy atomic force microscopy volta potential difference corrosion working principle

Published: 11 May 2018

CLC number:

TG174.3

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	SONG Bo
	CHEN Xu

Cite this article:

SONG Bo,CHEN Xu. Scanning Kelvin Probe Force Microscopy: Working Principle and Application in the Research of Materials Corrosion[J]. Materials Reports, 2018, 32(7): 1151-1157.

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http://www.mater-rep.com/EN/10.11896/j.issn.1005-023X.2018.07.016 OR http://www.mater-rep.com/EN/Y2018/V32/I7/1151

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